Wheat spike and grain trait information is essential for both breeders as researchers.
High quality phenotypic information helps to better understand the internal mechanisms and their interaction to the environment. For breeders it facilitates better targeted yield (related) selections in their breeding programs.
Typically the extraction of these traits is laborious and destructive and often important information, such as seed position, cannot be captured.
With automated X-Ray CT imaging the screening of ears can be done non-destructively and with high throughputs. Additionally many different traits can now be extracted.